The new 72DL PLUS ultrasonic thickness gauge delivers precision thickness measurements at high speed in a portable, easy-to-use device. With fast scanning, advanced algorithms and Olympus’ lowest-ever minimum thickness capability, the gauge can measure the thickness of very thin layers for challenging applications across industries.

Olympus is proud to introduce the OmniScan^® SX, a flaw detector that benefits from more than 20 years of phased array experience and shares the OmniScan DNA

High-Speed, High-Frequency, High-Precision Measurements. The Olympus 72DL PLUS ultrasonic thickness gauge delivers precision thickness measurements at high speed in a portable, easy-to-use device. With fast scanning, advanced algorithms, and our lowest-ever minimum thickness capability, you can confidently measure the thickness of very thin layers in the most challenging applications.